What is BS IEC 62951‑6 - Semiconductor devices about?
BS IEC 62951-6 is the sixth part of an International Standard used for Semiconductor devices.
BS IEC 62951-6 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Who is BS IEC 62951-6 - Semiconductor devices for?
BS IEC 62951-6 Semiconductor devices are beneficial for:
- Semiconductor foundries
- Manufacturers of electronic devices
- Manufacturers of automobile
- Quality control executives
Why should you use BS IEC 62951-6 - Semiconductor devices?
A semiconductor device is an electronic component that contains the electronic properties of semiconductor material.
BS IEC 62951-6 specifies the test methods and test procedure for sheet resistance of flexible conducting films used in semiconductor devices. The test methods help in measuring the sheet resistance are as follows:
- The 2-point probe test method is useful in measuring the In situ which help in determining the errors that are caused by probe resistance and the contact resistance.
- This 4-point probe method is an electric measuring technique for separating the pairs of current-carrying and voltage-sensing electrodes.
- Montgomery method is useful in measuring the sheet resistance that helps in ensuring the anisotropic resistivity of these devices.
By using BS IEC 62951-6, you can ensure the sustainability of these flexible conducting films in different conditions that results in manufacturing good quality semiconductor devices.
