What is BS IEC 63003 – Common test interface (CTI) pin map configuration about?
The scope of BS IEC 63003 is the definition of a pin map utilizing the IEEE 1505â„¢ 1 receiver fixture interface (RFI). The pin map defined within BS IEC 63003 shall apply to military and aerospace automatic test equipment (ATE).
Who is BS IEC 63003 – Common test interface (CTI) pin map configuration for?
BS IEC 63003 on common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM is useful for:
- Defence agencies
- Aerospace Industry
- Aeronautical engineers
- Testing and maintenance personnel
Why should you use BS IEC 63003 – Common test interface (CTI) pin map configuration?
ATE implementations have unique input/output (I/O) pinout definitions. This uniqueness has prevented the interoperability of test program sets (TPSs) among different ATEs within the same organizations. Even if the same RFI was used by the target ATE, the signals I/O could not be guaranteed to be at the same pin location. This is due to there being no suitable standard pinout definition for general purpose electronic testing applications.
BS IEC 63003 represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable:
- Pin map configuration
- Specific connector modules
- Respective contacts
- Recommended switching implementation
- Legacy automatic test equipment (ATE) transitional devices
This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
BS IEC 63003 is the only standard in the commercial market that provides such specifications on automatic test equipment and automatic test systems for common test interface pin map configuration.
