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summary
Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS). | Status: Current, Confirmed
description
1 Scope
This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Details
Publisher
BS
File size
1.03 MB
Pages
20
Format
PDF
Publication date
2011-12-31
ISBN-13
978-0-580-66876-0
ISBN-13 plain
9780580668760
ISBN-10
0580668760