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summary
Microbeam analysis. Focused ion beam application for TEM specimen preparation. Vocabulary. | Status: Current
description
1 Scope
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
Details
Publisher
BS
File size
999.89 KB
Pages
26
Format
PDF
Publication date
2025-05-29
ISBN-13
978-0-539-24981-1
ISBN-13 plain
9780539249811
ISBN-10
0539249811