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Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy. | Status: Current
Details
Publisher
BS
File size
869.16 KB
Pages
28
Format
PDF
Publication date
2005-03-31
ISBN-13
978-0-580-64479-5
ISBN-13 plain
9780580644795
ISBN-10
0580644795