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summary
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials. | Status: Revised, Superseded, Withdrawn
Details
Publisher
BS
File size
527.47 KB
Pages
32
Format
PDF
Publication date
2005-03-31
ISBN-13
978-0-580-45710-4
ISBN-13 plain
9780580457104
ISBN-10
0580457109