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summary
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials. | Status: Superseded, Withdrawn
description
1 Scope
This International Standard gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Details
Publisher
BS
File size
1.3 MB
Pages
38
Format
PDF
Publication date
2015-04-30
ISBN-13
978-0-580-87880-0
ISBN-13 plain
9780580878800
ISBN-10
0580878800