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Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy. | Status: Current
description
1 Scope
This document specifies a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy. This method applies to surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, Rsm, in the range of about 0,04 μm to 2,5 μm.
Details
Publisher
BS
File size
1.54 MB
Pages
34
Format
PDF
Publication date
2024-11-30
ISBN-13
978-0-539-23826-6
ISBN-13 plain
9780539238266
ISBN-10
0539238266