What is ISO 9286 about?
ISO 9286 is a standard that serves technical specifications for the chemical analysis of silicon carbide that enables the evaluation of surface defects and impurities.
ISO 9286 specifies the chemical analysis of silicon-carbide-based abrasive grains and crudes. It is applicable for the determination of the surface impurities of abrasives grains and the determination of SiC content of crushed crude when the silicon carbide content is greater than 95% (mass fraction).
ISO 9286 describes technical specifications such as terms and definitions, analysis of surface impurities, sampling, preparation for sampling and forming a test report for performing the chemical analysis of silicon carbide.
Who is ISO 9286 for?
ISO 9286 on chemical analysis of silicon carbide is applicable to:
- Abrasive grain manufacturers
- Importers and dealers of abrasive grain
- Companies dealing with ceramic and refractory products
- Test providers/ test houses
Why should you use ISO 9286?
Abrasive grains are materials that are hard and sharp and can be used to wear away another material when they are moved in pressurized contact. Silicon carbide is one such extremely hard element that is synthetically fabricated in laboratories and used as an abrasive.
ISO 9286 provides you with all the information and test procedures for chemical analysis of silicon carbide to investigate various surface impurities such as carbon, silicon dioxide, silicon, total carbon, surface iron, etc., which helps you detect surface defects and treat impurities.
The guidance in ISO 9286 allows you to enhance the quality of materials and treat impurities, which results in broadening the applicational uses of silicon carbide.
What’s changed since the last update?
BS ISO 9286:2021 supersedes BS ISO 9286:1997, which is now withdrawn.
Changes in BS ISO 9286:2021 include –
- 4.4 (former 3.4) “Determination of surface carbon (Csurf/free)” has been revised, consisting of 4.4.2 “Detection by gravimetric method” and 4.4.3 “Detection by infrared absorption (IR)” with direct and indirect method
- 4.5 (former 3.6) “Determination of surface silicon dioxide (SiO2surf): has been revised, consisting of 4.5.2 “Detection by HF/KF dissolving reactions” and 4.5.3 “Hydrofluoric acid loss” and 4.5.4 “Molybdenum blue spectrophotometry” has been added
- Former 3.7 “Calculation of the content of residual silicon carbide (SiCR): has been moved to 4.10, former 4.3 “Determination of total carbon” has been revised and has been moved to 4.8
- Former 3.10 and 3.11 for the determination of surface aluminium oxide have been deleted and determination of surface aluminium has been added to 4.9
- Former 3.12 for the determination of surface calcium oxide and surface magnesium oxide has been deleted and determination of surface calcium and surface magnesium has been added to 4.9
