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Electronic fee collection. Test procedures for user and fixed equipment. Conformance test for the onboard unit application interface | Status: Withdrawn, Superseded
description
1 Scope
This part of ISO/TS 14907 describes tests that verify on-board unit (OBU) conformance of implementations of functions and data structures, as defined in the implementation conformance statement based on ISO 14906:2011, for electronic fee collection (EFC) applications. After the tests of isolated data items and functions (C.1-C.2), an example is given for testing of a complete EFC transaction (C.3).
The scope of this part of ISO/TS 14907 comprises definitions of OBU conformance assessment tests of
- — basic dedicated short-range communication (DSRC) L7 functionality,
- — EFC application functions,
- — EFC attributes (i.e. EFC application information),
- — the addressing procedures of EFC attributes and (hardware) components [e.g. integrated circuit cards (ICC) and man-machine interfaces (MMI)],
- — the EFC transaction model, which defines the common elements and steps of any EFC transaction, and
- — the behaviour of the interface so as to support interoperability on an EFC-DSRC application interface level, see Figure 1.
- — assess OBU capabilities,
- — assess OBU behaviour,
- — serve as a guide for OBU conformance evaluation and type approval,
- — achieve comparability between the results of the corresponding tests applied in different places at different times, and
- — facilitate communications between parties.
- — small range: “exhaustive testing” of critical interoperability/compatibility features,
- — large range: testing of boundaries and random values, and
- — composite types: testing of individual items in sequence or parallel.
NOTE 1 The Device Under Test contains the Implementation Under Test.
Figure 3 — Documentation DUT supplier It is outside the scope of this part of ISO/TS 14907 to define tests that assess- — performance,
- — robustness, and
- — reliability of an implementation.
NOTE 2 ISO/TS 14907‑1 defines test procedures that are aimed at assessing performance, robustness and reliability of EFC equipment and systems.
NOTE 3 The ISO/IEC 10373 family of International Standards defines test methods for proximity, vicinity, integrated circuits(s) cards and related devices that may be relevant for OBUs that support such cards.
Annex D provides an informative overview of Japanese OBE conformance tests that are based on ISO/TS 14907 suite of standards, in order to illustrate how these can be applied in practice.
Details
Publisher
BS
File size
1.77 MB
Pages
90
Format
PDF
Publication date
2012-01-31
ISBN-13
978-0-580-73071-9
ISBN-13 plain
9780580730719
ISBN-10
0580730719