JEDEC JESD202 2006

Name: JEDEC JESD202 2006
Brand: JEDEC
SKU: jedec-jesd202-2006

system JEDEC 2006-12-01 22 PDF 540 0 2026-07-25 19:43

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summary

METHOD FOR CHARACTERIZING THE ELECTROMIGRATION FAILURE TIME DISTRIBUTION OF INTERCONNECTS UNDER CONSTANT-CURRENT AND TEMPERATURE STRESS:

Details

Publisher JEDEC

File size 365 KB

Pages 38

Format PDF

Publication date 2006-12-01

Rating ★★★★★

Points 540

File size 365 KB

Pages 38

Format PDF

Publication date 2006-12-01

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