What is PD IEC/TS 61586 - Reliability of electrical connectors about ?
PD IEC/TS 61586 is an international standard used for estimating the reliability of electrical connectors. PD IEC/TS 61586 can guide you in conducting the test method for estimating the reliability of the connectors.
PD IEC/TS 61586 deals with the estimation of the inherent design reliability of electrical connectors through the definition and development of an appropriate accelerated testing programme. The basic intrinsic degradation mechanisms of connectors, which are mechanisms that exist as a result of the materials and geometries chosen for the connector design, are reviewed to provide a context for the development of the desired test programme. While extrinsic degradation mechanisms may also significantly affect the performance of connectors, they vary widely by application and thus are not addressed in this document.
Who is PD IEC/TS 61586 - Reliability of electrical connectors for ?
PD IEC/TS 61586 on estimation of the reliability of electrical connectors is useful for:
- Manufacturers of electronic devices
- Manufacturers of automotive parts
- Manufacturers of circuit boards
- Electronic engineers
Why should you use PD IEC/TS 61586 - Reliability of electrical connectors ?
The electric connectors are electro-mechanical devices used for joining the electric conductors. These electric conductors help in creating electric circuits.
By using PD IEC/TS 61586, you can classify the mechanisms into intrinsic and extrinsic degradation mechanisms. These degradation mechanisms are useful in identifying the failures or defects of electronic connectors. The test methods mentioned in PD IEC/TS 61586 helps in evaluating the performance of the connectors. This test method is useful in determining the reliability of these electric connectors. Using reliability testing protocol, you can increase the contact resistivity of electronic connectors.
PD IEC/TS 61586 specifies the test methods and procedures for estimating the reliability of electrical connectors. This test method helps in increasing the performance of these connectors that results in producing better quality electronic devices.
What’s changed since the last update ?
PD IEC/TS 61586:2017 supersedes BS IEC 61586:1997. PD IEC/TS 61586:2017 includes some technical changes with respect to BS IEC 61586:1997. These include:
- A specific “basic” testing protocol is defined which utilizes a single test group subjecting connectors to multiple stresses
- Additional information is provided concerning test acceleration factors
- A discussion of the limitations of providing MTTF/MTBF estimates for connectors has been added
- The bibliography has been expanded
