What is PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC about?
Integrated circuits (IC) are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. PD IEC/TS 62132-9 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit.
This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization. PD IEC/TS 62132-9 is applicable to testing an IC mounted on any circuit board that is accessible to the scanning probe. In some cases, it is useful to scan not only the IC but also its environment.
Who is PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC for?
BS EN PD IEC/TS 62132-9 on the electromagnetic and radiated immunity of IC is useful for:
- Manufacturer of electronic equipment and components
- Manufacturer of electrical equipment and components
- Maintenance and augmentation teams
- Companies associated with designing and installation of electronic devices
- Fault management teams
- Quality management teams
Why should you use PD IEC/TS 62132-9 - Electromagnetic and radiated immunity of IC?
Techniques for generating near-fields over integrated circuits and their surrounding environment can identify the areas susceptible to radiation, which could cause errors in the device. The ability to associate magnetic or electric field strengths with a particular location on a device can provide valuable information for the improvement of an IC both in terms of functionality and EMC performance.
Near-field scan techniques have considerably evolved over recent years. The improved efficiency, bandwidth and spatial resolution of the probes offer analysis of integrated circuits operating into the gigahertz range. Post-processing can considerably enhance the resolution of a near-field scan test bench and the measured data can be shown in various ways per the user’s choice.
PD IEC/TS 62132-9 provides a mapping of the sensitivity (immunity) to electric- or magnetic-near-field disturbance over the IC. The resolution of the test is determined by the capability of the test probe and the precision of the Probe-positioning system. This method is intended for use up to 6 GHz. Extending the upper limit of frequency is possible with existing probe technology but is beyond the scope of this specification. The tests described in PD IEC/TS 62132-9 are carried out in the frequency domain using continuous wave (CW), amplitude modulated (AM) or pulse modulated (PM) signals. PD IEC/TS 62132-9 helps you assess the Electromagnetic and radiated immunity of IC.
The guidelines in PD IEC/TS 62132-9 enable you to provide a superior quality product to your customers.
