What is PD IEC/TS 62804-1-Crystalline silicon photovoltaic modules about?
The IEC 62804 series is a Technical Specification that discusses the various test methods of photovoltaic modules.
PD IEC/TS 62804-1 is the first part of the series that defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening test neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level.
The testing in this PD IEC/TS 62804-1 is designed for crystalline silicon PV modules with one or two glass surfaces, silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor, or electronically interacting with the silicon semiconductor itself. PD IEC/TS 62804-1 is not intended for evaluating modules with thin-film technologies, tandem, or heterostructure devices.
Who is PD IEC/TS 62804-1-Crystalline silicon photovoltaic modules for?
PD IEC/TS 62804-1 on photovoltaic modules
- PV module manufacturers
- PV power system manufacturers
- Photoelectric device manufacturers
- Solar energy engineering industry
- Product designers
- Quality assurance and testing personnel
Why should you use PD IEC/TS 62804-1-Crystalline silicon photovoltaic modules?
Potential-induced degradation refers to performance loss caused by stray currents in crystalline photovoltaic modules. This effect may result in a power loss of up to 30%.
PD IEC/TS 62804-1 provides test and evaluation procedures for the durability of crystalline silicon photovoltaic modules to the effects of short-term high voltage stress including potential-induced degradation.
The actual durability of modules to system voltage stress will depend on the environmental conditions under which they are operated. PD IEC/TS 62804-1 intended to assess photovoltaic module sensitivity to PID irrespective of actual stresses under operation in different climates and systems.
PD IEC/TS 62804-1 provides you with methods to measure the module design’s ability to withstand degradation from system voltage effects that manifest in the relatively short term.
Compliance with technical specifications in PD IEC/TS 62804-1 can help you to improve the durability and performance of the photovoltaic modules.
