PD ISO/TS 17915:2013

Optics and photonics. Measurement method of semiconductor lasers for sensing. | Status: Superseded, Withdrawn

1 Scope This Technical Specification describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. This Technical Specification is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. This Technical Specification is an application of ISO 13695, in which the physical bases are explained.