What is ISO/TS 22292 about?
ISO/TS 22292 provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction. It helps to measure the size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within electron-transparent rod-shaped support.
ISO/TS 22292 describes sample preparation, instrumentation setup, data acquisition and processing for 3D image reconstruction of nano-objects using TEM, from which dimensional parameter values can be determined and interpreted. Variation in methodology for use with scanning transmission electron microscopy (STEM) is included in an informative annex.
Who is ISO/TS 22292 for?
ISO/TS 22292 on nanotechnologies is applicable to:
- Electronics manufacturer
- Solar Cells manufacturer
- Battery manufacturer
- Aerospace industry
- Fuels industry
- Chemical sensors manufacturer
- Sporting goods industry
- Fabric industry
Why should you use ISO/TS 22292?
ISO/TS 22292 guidelines are useful for applications like calibration for a variety of nanoscale characterization tools, particularly nanoscale characterization instruments and artefacts, to ensure that they are applied in an efficient way.
ISO/TS 22292 provides guidelines for nanotechnology which have requirements to verify materials, processes, and products. quantitative measurement at the nanoscale, including three-dimensional (3D) image reconstruction of nano-objects using TEM, responds to this need.
