JEDEC JESD60A 2004
A PROCEDURE FOR MEASURING P-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION AT MAXIMUM GATE CURRENT UNDER DC STRESS:
JEDEC JESD6 1967
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:
JEDEC JESD59 1997
BOND WIRE MODELING STANDARD:
JEDEC JESD57 1996
TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION:
JEDEC JESD557D 2023
Statistical Process Control Systems
JEDEC JESD557C 2015
STATISTICAL PROCESS CONTROL SYSTEMS
JEDEC JESD55 1996
STANDARD FOR DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE BiCMOS LOGIC DEVICES:
JEDEC JESD54 1996
STANDARD FOR DESCRIPTION OF 54/74ABTXXX AND 74BCXXX TTL-COMPATIBLE BiCMOS LOGIC DEVICES:
JEDEC JESD531-1986 (2002)
JEDEC JESD53 1996
MANAGEMENT OF COMPONENT OBSOLESCENCE BY GOVERNMENT CONTRACTORS: RESCINDED, October 2002
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JEDEC JESD82-513-2023
JEDEC JESD82-511-2021
JEDEC JESD79-5C-2024
JEDEC JESD82-512-2023
JEDEC JESD79-3F-2012
JEDEC JESD79-4D-2021
JEDEC JESD79-5B-2022
JEDEC JEP162A-2019
jedec JEP 122G
JEDEC JEP122G provides reliability models and acceleration factors for common semiconductor device failure mechanisms.
JEDEC JESD79-3-3 2013
ADDENDUM No. 3 to JESD79-3 - 3D STACKED SDRAM
JEDEC JESD79-4-1B-2021
IPC JEDEC 9301-2018
JEDEC CS-002-A 1993
Standard - Thin Matrix Tray for Handling and Shipping of Plastic Qual Flatpack Packages (PQFP). Variations AA-AG. Ite...
IPC JEDEC 9703-2009 (2019)
JEDEC JESD82-30.01-2023
JEDEC CO-022-A 0
Registration - Plastic Magazine Plug Family. Variations AA-AC. Item 11.5-340.
EIA JEDEC JESD67-1999 errata 1999
JEDEC JESD88E 2013
DICTIONARY OF TERMS FOR SOLID-STATE TECHNOLOGY, 6th Edition
JEDEC SO-009A 2007
Registration - DDR2 DIMM 240 Pin SMT Socket Outline with 1.00 mm Contact Centers. Item 11.14-097.
JEDEC SO-005A 2005
Registration - 200 pin Mini DIMM with 0.60 mm Lead Centers Socket Outline