What is DD IEC/TS 62215-2 - Immunity of integrated circuits about?
Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. DD IEC/TS 62215-2 is a technical specification that contains general information and definitions on the test method to evaluate the immunity of integrated circuits against fast conducted synchronous transient disturbances.
DD IEC/TS 62215-2 also contains a description of measurement conditions, test equipment and test set-up as well as the test procedures and the requirements on the content of the test report. The objective of DD IEC/TS 62215-2 is to describe general conditions to obtain a quantitative measure of immunity of integrated circuits establishing a uniform testing environment. DD IEC/TS 62215-2 describes the critical parameters that are expected to influence the test results. Deviations from this specification should be explicitly noted in the individual test report.
Who is DD IEC/TS 62215-2 - Immunity of integrated circuits for?
BS EN DD IEC/TS 62215-2 on the immunity of integrated circuits is useful for:
- Manufacturer of electronic equipment and components
- Manufacturer of electrical equipment and components
- Maintenance and augmentation teams
- Companies associated with designing and installation of electronic devices
- Fault management teams
- Quality management teams
Why should you use DD IEC/TS 62215-2 - Immunity of integrated circuits?
Integrated circuits are fundamental building blocks of modern electronic devices. They function as oscillators, timers, computer memory, amplifiers, microcontroller, microprocessors, counters, or logic gates. There are certain specifications regarding the performance of these semiconductor devices.
The synchronous transient immunity measurement method, as described in DD IEC/TS 62215-2, uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the integrated circuit. In this method, the applied impulse should be synchronized with the activity of the integrated circuit to make sure that controlled and reproducible conditions can be assured.
DD IEC/TS 62215-2 help you assess the immunity of integrated circuits by discussing measurement philosophy, set-up concept, the response signal, coupling networks, test circuit board, IC-specific consideration, default test condition, impulse immunity of the test set-u, test equipment, set-up explanation, explanation of signal relations, calculation of time step and the number of measurements to be conducted, the test procedure, monitoring check, system verification, immunity limits or levels, performance classes, interpretation and comparison of results.
